FIB Technician - (3rd Shift)

3rd shift from 9:00 pm to 7:00 am (4 day Work week, 10 hours a day) Prepare samples for experiments, including sample coating, wafer cleaving, mounting/unmounting samples, and preparing jobs for experimentation to evaluate the performance of the process system. Prepare transmission electron microscope (TEM) lamella samples using focused ion beam (FIB), optimize sample preparation procedures and conditions, and identify cutting locations based on pattern instructions. Operate metrology tools in the FIB & TEM lab to understand cross-section or top-view critical dimensions (CD), identify patterns of interest, understand image quality requirements and sample/beam interactions to determine optimized conditions, and complete requested jobs under limited supervision after training. Perform SEM/FIB system and routine maintenance procedures such as flash, plasma cleaning, and image calibrations. Perform routine troubleshoot procedures, identify problems, restart or standby the tool. Coordinate instrument repair and maintenance. Coordinate with engineering on job request status. Operate supportive metrology equipment in a lab environment. Operate supportive metrology equipment for FIB-TEM lamella samples. Perform basic operations of Microsoft Outlook and Office software. Work shifts may include compressed work week schedules to meet production needs. Provides solutions to problems in situations that are atypical or infrequently occurring based on existing precedents or procedures Ability to lift up to 30 lbs. Has developed proficiency in a range of analytical processes or procedures to carry out assigned tasks Has a good understanding of how the team integrates with others to achieve objectives May provide informal guidance and support to more junior team members Uses communication skills to regularly exchange information