About the Role
We are seeking a Metrology Engineer with deep domain expertise in electron microscopy to join the
Waveguide Metrology Engineering team. In this role, you will own end -to -end FIB/SEM workflows—from
sample preparation through advanced imaging and analysis—supporting the characterization of optical
and semiconductor materials critical to next -generation AR/VR hardware. You will drive automation,
develop scalable metrology solutions, and collaborate cross -functionally to enable process development,
yield improvement, and technology roadmap execution.
Requirements
Responsibilities
â Own and develop end -to -end sample preparation and imaging workflows using Focused Ion
tBeam (FIB) and Scanning Electron Microscopy (SEM) techniques.
â Perform advanced characterization including Scanning Transmission Electron Microscopy
(STEM) and Energy Dispersive X -ray Spectroscopy (EDX/EDS) on complex optical and
semiconductor material systems.
â Drive automation of electron microscopy workflows to improve throughput, repeatability, and data
quality across metrology operations.
â Develop and qualify metrology applications for multi -layer, multi -material structures in support of
waveguide, thin -film, and nanofabrication process development.
â Partner cross -functionally with process engineering, integration, manufacturing operations, and
other metrology disciplines to deliver actionable characterization data for process control and
yield improvement.
â Establish process controls, Measurement Standard Operating Procedures (MSOPs), and
specification documents to ensure metrology capability and protect the fab from excursion events.
â Collaborate with equipment vendors (e.g., Thermo Fisher Scientific/FEI) to qualify, install, and
enable state -of -the -art electron microscopy platforms and capabilities.
â Cross -train across multiple metrology and inspection disciplines to maintain support continuity
and provide complementary measurements for baselining and qualifying application solutions.
â Contribute to metrology development roadmaps, support technology ramp -up activities, and
deliver leading -edge process capability in collaboration with cross -functional and cross -company
teams.
Minimum Qualifications
â Master's degree in Materials Science, Engineering, Physics, Chemistry, or a related
scientific/engineering field.
â Graduate -level coursework, research, or hands -on experience involving:
â Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM)
â Sample preparation techniques for cross -section and plan -view imaging
â STEM and/or EDX analytical methods
â Characterization of semiconductor or optical materials
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