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Intern - Metrology Process Development Engineer

Job Description - Intern - Metrology Process Development Engineer

Plan, design, and run experiments in a semiconductor cleanroom using state of the art technology. Analyze top-down and cross-sectional semiconductor structure metrology data using Excel and JMP. Work on new metrology technology and measurement techniques to ensure that our measurement capabilities meet the technical device roadmaps. Working closely with process development and process integration engineers to optimize measurements for multiple device process flows and layer stacks. Develop applications on next generation processes and technologies within Fab 4 and qualification for technology transfers to production fabs. Evaluations of new metrology tools to determine lowest cost of ownership solutions with the highest accuracy and precision for deployment in R&D and high-volume manufacturing. Deep understanding of Optical Metrology, Overlay/Registration, Profiling/Topography, X-Ray, electrical, or other metrology techniques. Background in data science and demonstrated interest in applying it to semiconductor metrology techniques with large data analytics requirements. Have process and equipment related experience or completed coursework in instrumentation and calibration procedures and semiconductor processing. Have developed a keen understanding of semiconductor manufacturing processes (diffusion, CVD, Etch, Lithography) and semiconductor process flows (NAND, DRAM). Possess strong computer skills, including MS Office and JMP, and programming languages such as MATLAB, Python, C, C++. Applicants should be working towards an M.S. or Ph.D. in Engineering, Physics, Material Science, or a semiconductor-related field. Must be a current student, must not graduate before September 2026. Have the flexibility to work individually, be part of a team, and lead a team at a per project level. Use strong communication and organizational skills. Demonstrate strong data analysis skills and a high level of attention to detail.
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