Intern - STPG PE NAND Reliability

Audit existing validation coverage against intrinsic reliability test flow and datasheet defined functionalities Identify gaps or overlooked areas in current test flows that could delay issue detection Recommend validation enhancement to improve robustness and shift issue detection earlier in the development cycle Deliverable: A comprehensive validation coverage matrix and improvement plan to enhance intrinsic reliability qualification and early issue detection Strong analytical and problem solving skills Understanding of Semiconductor Device Physics Effective communication skills in written and spoken English Self-motivation and enthusiasm for Innovation Approach Course of interest: Semiconductor Device Physics, Semiconductor Fabrication Duration Period: 6 months