Intern - TEM

Collaborate on the preparation of 3D NAND samples for 3D Electron Tomography analysis using Focus Ion Beam (FIB). Perform 3D Electron Tomography experiments using TEM/STEM/EFTEM, including tilt-series acquisition and reconstruction. Analyze tomographic data to extract structural and compositional information at the nanoscale. Collaborate with cross-functional teams including process integration, device engineering, and reliability to support root cause analysis and technology development. Document findings and present results in technical reports and team meetings. Devote to the continuous improvement of lab procedures, ensuring a safe and efficient working environment. Currently pursuing a PhD degree in Materials Science and Engineering, Applied Physics or a related field. Basic understanding of semiconductor device physics and materials characterization techniques. Hands-on experience with various TEM tools, including Nion, TFS, and JEOL. Proficiency in data analysis tools (e.g., DigitalMicrograph, MATLAB, Python) is advantageous. Experience with 3D reconstruction software (e.g., Avizo, IMOD, TomoJ, Inspect3D) is preferred. Strong problem-solving skills with a proven track record of innovation. Excellent communication skills and a collaborative, team-oriented mindset.